R&S®ZVB Vector Network Analyzers
Frequency ranges from 300 kHz to 4 GHz, 8 GHz, 14 GHz and 20 GHz, with two or four test ports
Frequency range | 300 kHz to 4 GHz (R&S®ZVB4) 300 kHz to 8 GHz (R&S®ZVB8) 10 MHz to 14 GHz (R&S®ZVB14) 10 MHz to 20 GHz (R&S®ZVB20) |
Number of test ports | R&S®ZVB4: two or four R&S®ZVB8: two or four R&S®ZVB14: two or four R&S®ZVB20: two or four |
Measurement time per test point at 500 kHz IF bandwidth, CW mode | <4.5 µs |
Measurement time (201 test points) | <4.5 ms |
Data transfer time (201 test points) Via IEC/IEEE bus Via VX11 over 100 Mbit/s LAN Via RSIB over 100 Mbit/s LAN | <2.9 ms <1.3 ms <0.7 ms |
Switching time Between channels Between instrument setups | <1 ms <10 ms |
Dynamic range at 10 Hz measurement bandwidth (depends on instrument type) | |
Between test ports (specified) | >123 dB |
Between test ports (typical) | >133 dB |
Output power at test port | >13 dBm, typ. 15 dBm |
Power sweep range | >50 dB, typ. 60 dB |
IF bandwidths | 1 Hz to 500 kHz |
Number of channels, diagrams, traces | >100 each |
Number of test points per trace | 1 to 60001 |
Operating system | Windows XP Embedded |
Test set
The test set is made up of independent reflectometer units, each with a generator path, a measurement receiver, and a reference receiver for each test port. Electronic switches for forward/reverse switchover of measurement paths are not required in the test set. The use of the reflectometer concept allows each test port to carry out measurements like a one-port network analyzer.
This new hardware concept allows parallel measurements on different DUTs or different ports of a DUT. Data processing is likewise in parallel up to the display, which considerably reduces measurement time. For example, the reflection parameters (S11 to S44) of four DUTs can be measured in parallel, reducing measurement time by a factor of four. Measurements are performed and data is transferred via IEC/IEEE bus or LAN virtually at the same time.
The analyzer's frontend receivers are based on a fundamental mixing concept, which has already proven successful with the R&S® ZVR family. This concept provides a wide dynamic range of typically 130 dB and low trace noise at large measurement bandwidths. The test port output power can be electronically varied by more than 50 dB, allowing nonlinear parameters of active components to be measured quickly and wear-free. When measuring active components, the required DC power is input via the PORT BIAS
Click thumbnails to see screenshots:
Two-port model
Four-port model
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